Journal of Scanning Probe Microscopy

Aims and Scope

Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine. Highest priority will be given to short communications reporting important new scientific and technological findings. To speed up the reviewing process, we will provide on-line refereeing of all articles submitted in electronic form. Authors will receive the following benefits:

Electronic submission of articles
Fast reviews
Rapid times to publication
No page charges
Free color where justified
Distinguished editorial board
Availability in print and online editions

RESEARCH TOPICS COVERED (but not limited to)

Both original research and technical contributions dealing with various aspects of SPM (STM, AFM, SNOM) and SPM-related techniques such as lateral force microscopy (LFM), chemical force microscopy (CFM), piezoresponse force microscopy (PFM), electrostatic force microscopy (EFM), magnetic force microscopy (MFM), thermal scanning microscopy (TSM), scanning capacitance microscopy (SCM), phase detection microscopy (PDM), scanning surface potential microscopy (SSPM) or Kelvin probe microscopy, and force modulation microscopy (FMM) to characterize, image and analyze biological materials, chemical materials, polymers, magnetic materials, metals, semiconductors, electronic materials, glasses, composite, ceramics, coatings, nanoscale devices, structures, etc; SPM and SPM-related techniques to study abrasion, adhesion, corrosion, etching, friction, lubrication, plating, cleaning as well as polishing; Micro to nanofabrication, lithography, patterning and nanomanipulation with SPM; Advances and development in the SPM systems, specimen preparation, instrumentation, methods and concepts; Quantitative methods in SPM for biological, chemical, materials science and engineering; Theories, modeling, analysis, and simulation on SPM, and much more.

Readership

Scientists, engineers, biologists and all others working in the fields of scanning probe microscopy having connections with chemistry, physics, medicine, materials science and engineering, surface science and engineering, electrical engineering, polymer science and engineering, biological sciences, pathology, life sciences, nanotechnology, and all related disciplines.

Submit Your Manuscript Electronically as a PDF or MS Word file to the Editor-in-Chief

Editor-in-Chief
Professor San-Qiang Shi
Department of Mechanical Engineering
The Hong Kong Polytechnic University
Hung Hom, Kowloon, Hong Kong
Tel: (852) 2766-7821
Fax: (852) 2365-4703
Email: mmsqshi@polyu.edu.hk

Website: www.aspbs.com/jspm

Referee's Report
Please prepare and submit Reviewer's Report on the Journal of Scanning Probe Microscopy homepage.

Subscription
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