Journal of SCANNING PROBE MICROSCOPY
	EDITOR-IN-CHIEF
	Professor San-Qiang Shi Department of Mechanical Engineering The Hong Kong Polytechnic University Hung Hom, Kowloon, Hong Kong, China Tel: +852-2766-7821 Fax: +852-2365-4703 Email: mmsqshi@polyu.edu.hk
	ASSOCIATE EDITORS Dr. Aleksandra Djurišic, The University of Hong Kong, Hong Kong, China; E-mail: dalek@hkusua.hku.hk Prof. S. De Feyter, Katholieke Universiteit Leuven, Belgium; E-mail: Steven.DeFeyter@chem.kuleuven.be Prof. S. W. Hla, Ohio University, USA; E-mail: hla@helios.phy.ohiou.edu
	EDITORIAL BOARD R. J. B. Bachelot, University of Technology of Troyes, France U. Bakowsky, University of Marburg, Germany F. Besenbacher, University of Aarhus, Denmark L. A. Bottomley, Georgia Institute of Technology, USA N. Chandrasekhar, Institute of Materials Research and Engineering, Singapore A. B. Djurisic, University of Hong Kong, China W. A. Ducker, University of Melbourne, Australia S. De Feyter, Katholieke Universiteit Leuven, Belgium R. Garcia, Instituto de Microelectronica de Madrid, Spain C. Girard, CEMES/CNRS, Toulouse, France S. Gwo, National Tsing-Hua University, Taiwan U. Hartmann, University of Saarbrücken, Germany S. W. Hla, Ohio University, USA B. D. Huey, University of Connecticut, USA W. Jhe, Seoul National University, South Korea P. Kruse, McMaster University, Canada C. M. Lieber, Harvard University, USA Z. F. Liu, Peking University, China E. Meyer, University of Basel, Switzerland C. A. Mirkin, Northwestern University, USA H. Onishi, Kobe University, Japan L. J. Qiao, University of Science and Technology Beijing, China J. E. Sader, University of Melbourne, Australia U. S. Schubert, Eindhoven University of Technology, Netherlands Z. F. Shao, University of Virginia Medical School, USA W. Sigmund, University of Florida, USA D. A. Smith, University of Leeds, UK B. S. Swartzentruber, Sandia National Laboratories, USA Q. Tang, Hong Kong Polytechnic University, China T. Ushiki, Niigata University, Japan G. Julius Vancso, University of Twente, Netherlands Y. Wu, National University of Singapore, Singapore X. D. Xiao, Hong Kong University of Science and Technology, China
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