| EDITORIAL BOARD | |
| IN MEMORY: We are very sad to notify that Professor Chandra S. Vikram, Editor-in-Chief of the Journal of Holography and Speckle passed away on 17th August after a massive heart attack. It is a big loss to all of us and the scientific community. All colleagues are planning to have an international award through SPIE in Chandra’s name. The Chandra S. Vikram Award for Optical Metrology. If you are interested in contributing to this award then please contact Professor H. John Caulfield accordingly. | |
| EDITOR-IN-CHIEF | |
| Professor
H. John Caulfield Fisk University 1000 17th Ave. N. Nashville, TN 37208, USA Phone: (615) 329-8785 Fax: (615) 329 -8634 E-mail: hjc@fisk.edu |
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| EUROPEAN EDITORS | |
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Prof. Dr. Malgorzata Kujawinska Prof. Dr. Wolfgang Osten |
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| ASIAN EDITORS | |
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Professor Rajpal S. Sirohi Professor Mitsuo Takeda |
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| EDITORIAL BOARD | |
| Ali Adibi, Georgia
Institute of Technology, USA Oleg Angelsky, Chernivtsy University, Ukraine Anand K. Asundi, Nanyang Technological University, Singapore Partha P. Banerjee, University of Dayton, USA Hans I. Bjelkhagen, De Montfort University, UK H. John Caulfield, Diversified Research Corporation, USA Frank Chen, Ford Motor Company, USA Steven H. Collicott, Purdue University, USA Katherine Creath, University of Arizona, USA Aristide Dogariu, University of Central Florida, USA Andreas Ettemeyer, Independent Consultant, Ulm, Germany Ruhua Fang, Tongji University, China Nikita Fomin, Heat and Mass Transfer Institute, Belarus Zoltán Füzessy, Budapest University of Technology and Economics, Hungary A. R. Ganesan, National Institute of Technology, India Roland Höfling, ViALUX GmbH, Germany Neil A Halliwell, Loughborough University, UK Steen G. Hanson, Risoe National Laboratory, Denmark Klaus Hinsch, Carl von Ossietzky University of Oldenburg, Germany Peter R Hobson, Brunel University, UK Brian G. Hoover, Advanced Optical Technologies, USA J. M. Huntley, Loughborough University, UK Charles Joenathan, Rose-Hulman Institute of Technology, USA Henryk Kasprzak, Wroclaw University of Technology, Poland Guillermo H. Kaufmann, Universidad Nacional de Rosario, Argentina Toshihiro Kubota, Kyoto Institute of Technology, Japan Vladimir Markov, MetroLaser Incorporated, USA V. M. Murukeshan, Nanyang Technological University, Singapore Tuck Wah Ng, National University of Singapore, Singapore Cafer Özkul, Rouen University, France Martin J. Pechersky, Westinghouse Savannah River Company, USA Ting-Chung Poon, Virginia Polytechnic Institute and State University, USA Pramod Rastogi, Swiss Federal Institute of Technology, Switzerland D. K. Saldin, University of Wisconsin, Milwaukee, USA Chandra Shakher, National Institute of Technology, India Joseph Shamir, Technion-Israel Institute of Technology, Israel Ching-Cherng Sun, National Central University, Taiwan Ralf. P. Tatam, Cranfield University, UK Akira Tonomura, Advanced Research Laboratory, Hitachi, Ltd., Japan Roberto Torroba, Centro de Investigaciones Opticas, Argentina James D. Trolinger, MetroLaser Incorporated, USA Sergey S. Ulyanov, Saratov State University, Russia John Watson, University of Aberdeen, UK William K. Witherow, NASA Marshall Space Flight Center, USA Ichirou Yamaguchi, Gunma University, Japan Lianxiang Yang, Oakland University, USA Luping Yu, University of Chicago, USA |
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