EDITORIAL BOARD
	EDITOR-IN-CHIEF
	Dr. Patrick GIRARD Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) 161 rue Ada, 34392 Montpellier cedex 05, FRANCE Tel.: (+33) 467 418 629 Fax: (+33) 467 418 500 Email: girard@lirmm.fr
	EDITORIAL BOARD
	E. Acar, IBM Research Laboratory., USA A. J. Acosta, University of Sevilla, Spain B. M. Al-Hashimi, University of Southampton, UK Mohab H. Anis, University of Waterloo, CA M. Ansorge, EPFL and University of Neuchatel, Switzerland M. J. Bellido, University of Sevilla, Spain L. Benini, University of Bologna, Italy E. I. Boemo, University of Autonoma Madrid, Spain M. Chan, Hong Kong University of Science & Technology, China N. Chang, Seoul National University, South Korea K. Choi, Seoul National University, South Korea V. De, Intel Corporation, USA W. Dehaene, KU Leuven, Belgium J. Figueras, University Polytechnic Catalunya, Spain E. G. Friedman, University of Rochester, USA A. García-Ortiz, Anafocus, Spain E. Guidetti, STMicroelectronics Inc., Switzerland J. Haid, Infineon Technologies, Austria J. Henkel, University of karlsruhe, Germany M. Hirech, Synopsys Inc. USA T. Ishihara, Kyushu University, Japan N. Jha, Princeton University, USA J. Kim, Seoul National University, South Korea A. K. Jones, University of Pittsburgh, USA J. D. Legat, Universite Catholique de Louvain, Belgium P. Li, Texas A&M University, USA X. Li, Chinese Academy of Sciences, Beijing, China C. Lichtenau, IBM Research Labs., Germany E. Macci, Politecnico di Torino, Italy Y. Manoli, University of Freiburg, Germany M. Miranda, IMEC, Belgium K. Muhammad, Texas Instruments, USA V. Narayanan, Pennsylvania State University, USA S. Nazarian, Magma Design Automation, USA W. Nebel, University of Oldenburg, Germany B. Nikolic, University of California at Berkeley, USA Vojin G. Oklobdzija, University of Texas at Dallas, USA R. Panda, Freescale Semiconductor Inc., USA B. C. Paul, Toshiba America Research, USA M. Pedram, University of Southern California, USA F. Pessolano, NXP Semiconductors, The Netherlands P. Petrov, University of Maryland, USA C. Piguet, CSEM, Switzerland A. Raghunathan, NEC Labs, USA C. P. Ravikumar, Texas Instruments, India M. Renaudin, TIMA, France K. Roy, Purdue University, USA R. Sankaralingam, Cadence Design Systems, USA M. Sarrafzadeh, UCLA, USA O. Sentieys, ENSSAT University of Rennes, France W. A. Serdijn, Delft University of Technology, Netherlands L. Shang, University of Colorado at Boulder, USA R. Singh, Clemson University, USA D. Soudris, Democritus University of Thrace, Greece M.R. Stan, University of Virginia, USA E. Talpes, AMD Inc., USA J. P. Teixeira, Institute of Systems and Computer Engineering, Portugal N. A. Touba, University of Texas at Austin, USA T. Tuan, Xilinx Research Labs., USA A. Tyagi, Iowa State University, USA K. Uchiyama, Hitachi, Ltd., Japan G. Y. Wei, Harvard University, USA P. Wong, Stanford University, USA H. J. Wunderlich, University of Stuttgart, Germany S. Yoo, Samsung Electronics, South Korea H. Yu, Berkeley Design Automation, Inc., USA
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